Yi Ren1, Chih-Li Chang2, Li-Yu Ting2, Li Zhou1, Jing-Yu Mao1, Shi-Rui Zhang1, Ho-Hsiu Chou2,*, Jia-Qin Yang1, Ye Zhou1,*, Su-Ting Han1,*
1 Institute for Advanced Study and College of Electronic Science & Technology, Shenzhen University, Shenzhen, 518060 P. R. China
2 Department of Chemical Engineering, National Tsing Hua University, Hsinchu, 30013 Taiwan