Qilin Hua1, Huaqiang Wu1,*, Bin Gao1,*, Meiran Zhao1, Yujia Li1, Xinyi Li1, Xiang Hou2, Meng‐Fan (Marvin) Chang3, Peng Zhou2,*, He Qian1
1 Institute of Microelectronics, Tsinghua University, Beijing, 100084 China
2 State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, 200433 China
3 Department of Electrical Engineering, National Tsing Hua University, Hsinchu, 30013 Taiwan