Leijin Fan1, Xiaofeng Yang2*, Hu Sun1*
工业和信息化部电子第五研究所杨晓锋博士,厦门大学孙虎副教授
1 School of Aerospace Engineering, Xiamen University, Xiamen 361005, China
2 Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, The Fifth Electronics Research Institute of the Ministry of Industry and Information Technology, Guangzhou 511370, China