Shaoteng Wu,*ab Qimiao Chen,*a Lin Zhang,a Huixue Ren,b Hao Zhou,a Liangxing Hua and Chuan Seng Tanac
中国科学院半导体研究所伍绍腾博士,南洋理工大学陈其苗博士
a School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798
b State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, P.R. China
c Institute of Microelectronics, A*STAR, Singapore